Bibliography¶
[1] | Niels C. Krieger Lassen. Automated determination of crystal orientations from electron backscattering patterns. PhD thesis, The Technical Univsersity of Denmark, 1994. |
[2] | Rafael C. Gonzalez and Richard Eugene Woods. Digital image processing. Prentice Hall, Upper Saddle River, New Jersey, USA, third edition, 2008. ISBN 013168728X, 9780131687288. |
[3] | J. Kittler and J. Illingworth. Minimum error thresholding. Pattern Recognition, 19:41–47, 1986. |
[4] | J. N. Kapur, P. K. Sahoo, and A. K. C. Wong. A new method for gray level picture thresholding using the entropy of the histogram. Graph. Models Image Process., 29:273–285, 1985. |
[5] | Stuart I. Wright and Matthew M. Nowell. EBSD image quality mapping. Microscopy & Microanalysis, 12:72–84, 2006. |
[6] | Xiaodong Tao and Alwyn Eades. Errors, artifacts, and improvements in ebsd processing and mapping. Microscopy & Microanalysis, 11:79–87, 2005. |
[7] | Keith Dicks and Scott D. Sitzman. personal communication, 2009. |
[8] | R. O Duda and P. E. Hart. Use of hough transform to detect lines and curves in picture. Communications of the ACM, 15(1):11–15, 1972. doi:10.1145/361237.361242. |
[9] | Angus J. Wilkinson and Peter B. Hirsch. Electron diffraction based techniques in scanning electron microscopy of bulk materials. Micron, 28(4):279–308, 1997. doi:10.1016/S0968-4328(97)00032-2. |
[10] | Oxford Instruments plc. Electron back-scattered diffraction explained. Technical Report, Oxford Instruments plc., 2004. |
[11] | Niels C. Krieger Lassen. Automatic high-precision measurements of the location and width of Kikuchi bands in electron backscatter diffraction patterns. Journal of Microscopy, 190(3):375–391, 1998. doi:10.1046/j.1365-2818.1998.00330.x. |
[12] | J. Frank and L. Al-Ali. Signal-to-noise ratio of electron micrographs obtained by cross correlation. Nature, 256:376–379, July 1975. doi:10.1038/256376a0. |
[13] | P. Cizmar, A.E. Vladár, B. Ming, and M.T. Postek. Simulated sem images for resolution measurement. Scanning, 30:381–391, 2008. doi:10.1002/sca.20120. |
[14] | R. R. Keller, A. Roshko, R. H. Geiss, K. A. Bertness, and T. P. Quinn. EBSD measurement of strains in GaAs due to oxidation of buried AlGaAs layers. Microelectronic Engineering, 75(1):96–102, 2004. doi:10.1016/j.mee.2003.11.010. |
[15] | Roumen Petrov, Leo Kestens, Anna Wasilkowska, and Yvan Houbaert. Microstructure and texture of a lightly deformed TRIP-assisted steel characterized by means of the EBSD technique. Materials Science and Engineering A, 447(1-2):285–297, February 2007. doi:10.1016/j.msea.2006.10.023. |
[16] | L. Ryde. Application of EBSD to analysis of microstructure in commercial steels. Materials Science and Technology, 22(11):1297–1306, 2006. doi:10.1179/174328406X130948. |
[17] | Jinghui Wu, Peter J. Wray, Calixto I. Garcia, Mingjian Hua, and Anthony J. Deardo. Image quality analysis: a new method of characterizing microstructures. ISIJ International, 45(2):254–262, 2005. doi:10.2355/isijinternational.45.254. |
[18] | P. J. Szabó and I. Szalai. Effect of monotonic and cyclic deformation on the IQ-maps of austenitic stainless steel. Materials Science Forum, 473-474:267–272, 2005. doi:10.4028/www.scientific.net/MSF.473-474.267. |
[19] | Xiadong Tao. An EBSD study on mapping of small orientation differences in lattice mismatched heterostructures. PhD thesis, Lehigh University, 2003. |
[20] | David C. Joy. SMART - a program to measure SEM resolution and imaging performance. Journal of Microscopy, 208(1):24–34, 2002. doi:10.1046/j.1365-2818.2002.01062.x. |
[21] | Angus J. Wilkinson and David J. Dingley. Quantitative deformation studies using electron backscatter patterns. Acta Metallurgica et Materialia, 39(12):3047–3055, 1991. doi:10.1016/0956-7151(91)90037-2. |
[22] | F. J. Humphreys. Characterisation of fine-scale microstructures by electron backscatter diffraction (EBSD). Scripta Materialia, 51(8):771–776, 2004. doi:10.1016/j.scriptamat.2004.05.016. |
[23] | Cyril Cayron. ARPGE: a computer program to automatically reconstruct the parent grains from electron backscatter diffraction data. Journal of Applied Crystallography, 40(6):1183–1188, 2007. doi:10.1107/S0021889807048777. |
[24] | H. Hielscher and Helmut Schaeben. A novel pole figure inversion method: specification of the MTEX algorithm. Journal of Applied Crystallography, 41(6):1024–1037, 2008. doi:10.1107/S0021889808030112. |
[25] | Angus J. Wilkinson, Graham Meaden, and David J. Dingley. High-resolution elastic strain measurement from electron backscatter diffraction patterns: new levels of sensitivity. Ultramicroscopy, 106(4-5):307–313, 2006. doi:10.1016/j.ultramic.2005.10.001. |