Peaks count

Quality metric that is computed from the number of bands/peaks identified in the Hough transform. The rational is that the Kikuchi bands of high quality diffraction patterns should be easier to identify in the Hough transform than those of lower quality patterns. This quality is however dependent on the thresholding and peaks positioning operations. It is also orientation dependent and is largely influence by false positive peaks.

\[Q = N\]

where N is the number of peaks identified in the Hough transform

Example on NiCoCrAlY sample